Applied RHEED (kartoniertes Buch)

Reflection High-Energy Electron Diffraction During Crystal Growth, Springer Tracts in Modern Physics 154
ISBN/EAN: 9783662156148
Sprache: Englisch
Umfang: ix, 220 S., 169 s/w Illustr., 11 farbige Illustr.,
Einband: kartoniertes Buch
InhaltsangabeMBE-grown semiconductor interfaces.- Reflection high-energy electron diffraction (RHEED).- RHEED oscillations.- Semikinematical simulations of RHEED patterns.- Kikuchi lines.- RHEED with rotating substrates.- Reconstruction-induced phase shifts of RHEED oscillations.- Energy loss spectroscopy during growth.- Phase shifts: Models.- Applications of reconstruction-induced phase shifts.- Closing remarks.
InhaltsangabeMBE-grown semiconductor interfaces.- Reflection high-energy electron diffraction (RHEED).- RHEED oscillations.- Semikinematical simulations of RHEED patterns.- Kikuchi lines.- RHEED with rotating substrates.- Reconstruction-induced phase shifts of RHEED oscillations.- Energy loss spectroscopy during growth.- Phase shifts: Models.- Applications of reconstruction-induced phase shifts.- Closing remarks.