Circuit Design for Reliability (gebundenes Buch)
Verlag:
ISBN/EAN: 9781461440772
Sprache: Englisch
Umfang: vi, 272 S., 58 s/w Illustr., 132 farbige Illustr.,
Einband: gebundenes Buch
Erschienen am
08.11.2014
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
InhaltsangabeAtomistic simulations of reliability.- Physical mechanisms of aging effects.- Noise and aging effects.- Radiation effects.- Compact modeling of device and circuit reliability.- On-chip characterization of circuit reliability.- Circuit resilience roadmap.- Circuit layout for reliability.- Robust memory design under variation and aging effects.- Reliable design under low-frequency noise.- Variability Aware Clock Design.- Radiation Tolerance Techniques.- Thermal effects compensation.- Scaling trends and conclusion.
